Upsilon Analysis in p+p 2009

Upsilon cross-section in p+p collisions at sqrt(s_NN) = 200 GeV, 2009 data.

PAs: Kurt Hill, Andrew Peterson, Gregory Wimsatt, Anthony Kesich, Rosi Reed, Manuel Calderon de la Barca Sanchez.

• Dataset QA (Andrew Peterson)
  • Trigger ID, runs
  • Run by Run QA
  • Integrated Luminosity estimate
  • Systematic Uncertainty
• Acceptance (Kurt Hill)
  • Raw pT, y distribution of Upsilon
  • Accepted pT, y distribution of Upsilons
  • Acceptance
  • Raw pT, eta distribution of e+,e- daughters
  • Accepted pT, eta distribution of e+,e- daughters
  • Comparison plots between single-electron embedding, Upsilon embedding
• L0 Trigger
  • DSM-ADC Distribution (data, i.e. mainly background) (Drew)
  • DSM-ADC Distribution (Embedding) For accepted Upsilons, before and after L0 trigger selection
  • Systematic Uncertainty (Estimate of possible calibration and resolution systematic offsets).
  • "highest electron/positron Et" distribution from embedding (Accepted Upsilons, before and after L0 trigger selection)
• L2 Trigger
  • E1 Cluster Et distribution (data, i.e. mainly background)
  • E1 Cluster Et distribution (embedding, L0 triggered, before and after all L2 trigger cuts)
  • L2 pair opening angle (cos theta) data (i.e.  mainly background)
  • L2 pair opening angle (cos theta) embedding. Needs map of (phi,eta)_MC to (phi,eta)_L2 from single electron embedding. Then a map from r1=(phi,eta, R_emc) to r1=(x,y,z) so that one can do cos(theta^L2) = r1.dot(r2)/(r1.mag()*r2.mag()). Plot cos theta distribution for L0 triggered events, before and after all L2 trigger cuts. (Kurt)
  • L2 pair invariant mass from data (i.e. mainly background)
  • L2 pair invariant mass from embedding. Needs simulation as for cos(theta), so that one can do m^2 = 2 * E1 * E2 * (1 - cos(theta)) where E1 and E2 are the L2 cluster energies. Plot the invariant mass distribution fro L0 triggered events, before and after all L2 trigger cuts. (Kurt)
• PID (Greg)
  • dE/dx
    • dE/dx vs p for the Upsilon triggered data
    • nsigma_dE/dx calibration of means and sigmas
    • Cut optimization (Maximization of electron effective signal)
    • Final cuts for use in data analysis
  • E/p
    • E/p distributions for various p bins
    • Study of E calibration and resolution between data and embedding (for L0 Trigger systematic uncertainty)
    • Resolution and comparison with embedding (for cut efficiency estimation) (Kurt and Greg)
• Yield extraction
  • Invariant mass distributions
    • Unlike-sign and Like-sign inv. mass (Drew)
    • Like-sign subtracted inv. mass (Drew)
    • Crystal-Ball shapes from embedding/simulation. (Kurt) Crystal-ball parameters to be used in fit (Drew)
  • Fit to Like-sign subtracted inv. mass, using CB, DY, b-bbar.
    • Contour plot (1sigma and 2sigma) of b-bbar cross section vs. DY cross section. (Drew)
    • Upsilon yield estimation and stat. + fit error. (Drew)
  • (2S+3S)/1S (Drew)
• p_T Spectra (Drew)
• Cross section calculation.
  • Yield
  • Integrated luminosity
  • Efficiency (Numbers for each state, and cross-section-branching-ratio-weighted average)
  • Uncertainty
• h+/h- Corrections