sTGC HV Scan (Collider data)
Hit selection: Timebin ( -70 < tb < 20 )
Cluster selection:
- Clusters with >= 1 strips (All) : d361_ge1_summary.pdf
- Clusters with >= 2 strips : d361_ge2_summary.pdf
- Clusters with >= 3 strips : d361_ge3_summary.pdf
- Clusters with >= 4 strips : d361_ge4_summary.pdf
- Clusters with >= 5 strips : d361_ge5_summary.pdf
- Clusters with >= 6 strips : d361_ge6_summary.pdf
A few observations:
- The trends *make sense* now - using data for all HV settings from a single fill with consistent beam conditions.
- Selecting clusters with several strips hit (>=4) shows a trend of +0.1 % efficiency per volt (about 20% difference between 2800V to 3000 V)
- ADC saturation increases with HV at the rate of 0.02% / V, from 4% at 2850 V to 7% at 3000 V
- Number of strips per real cluster increases with HV at 0.003 / V so you will have on average 0.6 more strips hit per cluster at 3000V compared to 2800 V.
NOTE: All of these measurements were taken with the stgc_n_sigma noise threshold of 15.
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