Follow up to SMD cut efficiency: data vs simulation

The figure below shows the energy distribution of SMD strips for both data (black) and simulation (red). Strips are numbered 1-7, where strip #4 is the highest energy strip in an SMD cluster associated with an electron (minus smd cuts). The remaining 6 strips are the nearest 3 neighboring strips on each side of strip #4. For this study, the neighboring strips are not required to be part of the cluster. Additionally, only 7 consecutive strips with good status are included.

The comparison shows a harder E distribution for data, compared to simulation in the neighboring strips. In the seed (strip #4) strip, the data shows the effect of trigger turn-on, which is not seen in the simulation. Currently, trigger simulation is not applied in the simulation data. This presents a possible follow-up: apply trigger simulation to sim data.

SMD clustering threshold for seed energy is 0.7 GeV. From the energy distribution of strip #4, 83.9 (77.5)% of eta (phi) strips pass the energy threshold and will be clustered in the data. In simulation, the corresponding number is 83.2 (84.1)%. However, this study still required that the matched EMC point have both SMD planes. Another possible follow-up is to release the two planes requirement, thus opening up the ability to compare the possibility / frequency of having both planes between data and simulation.

The excess of low energy strips in data (as compared to sim) may point to the shower energy threshold currently being investigated, where shower particles with energy below the threshold are not saved in the simulation data. This can be confirmed with the new simulation data.

Possible follow-up actions:

1. Apply trigger simulation to simulation data

2. Remove 2 planes requirement in matched EMC points.