Contents of this slide

1. pure electron sample
2. 2D fit results for the pure electron sample
3. tof matching efficiency w/ the pure electron sample
4. VpdDiff cut effects on centrality

The second presentation contains 

1. tof matching efficiency study: comparison of old and new efficiency w/ pure electron sample.
2. PID check: compare old and new parameters & selected track shape comparison between real data and toy MC.
3. new pt spectrum w/ new optimized track cuts.
4. Pair efficiency details