1) Run16 fastsim and D0 - Xiaolong Chen
Slide 6 - .For peripheral events the vertex position may be biased towards the D0 decay vertex.
Is it then the effect different for D0 daughters compared to this slide. Suggested to check in Hijing.

Use run 16 embedding to extract the final efficiency. Use phi dependent efficiency corrections.

Slide 19 - shows one HFT sector out . Can it be checked online? Possibly due to using only small data sample.

2) J/psi polarization measurement in Run12 - Siwei Luo

Test handling of the bin-by-bin systematic errors as correlated when calculating the trend.

Check the change in efficiencies after improving the TOF efficiency extraction.