Here I have the first captures from the Texas Instruments ADS52J90

 
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Test Conditions:

-The input signal is 1Vp-p gaussian pulse, 100ns wide with a 10KHz burst rate.

-Input coupling: AC coupled through pulse transformer

=> AC coupling is only for initial testing. Later test will use DC coupling but need to make input signal conditioning circuit similar to design I used on DEP32 ADC board 

-ADC in 12 Bit mode

- Sampling rate: 50MHz (ADC external clock) 50 MSPS

-Data points exported to Excel

120ns gaussian input pulse: ~1Vp-p, 50MHz sampling rate (50MSPS), 12 BIT

Small input signal analysis: 50mV input: 50MHz sampling rate (50MSPS), 12 BIT

The next step is to test the ADS52J90 with DC coupled signal. The DC buffer/amplifier will be ported from the design I did for the DEP32 ADC boards. This design provided very good SNR and excellent linearity.

June 2023: I found my LTC6403 prototype circuit I used to DC couple the DEP32 ADC.

 

        This test has two purposes:


  1) examine how the ADS 52J90 responds to a baseline shift