1) Upsilon in p+p 500 GeV - Leszek Kosarzeski
slide 4: change pt parametrization to better describe data shape
slide 5-19: by minimizing Chi2 based on Jpsi invmass shape difference between data and smeared embedding does not describe the Jpsi width vs pt
slide 20: minimize Chi2 based on Jpsi invmass width difference between data and smeared embedding better describe Jpsi width vs pt
slide 32: some parameters are fixed in the fit, their effects on the results will be studied as systematic uncertainties 
slide 37-39: yield and ratio from fit is consistent with that from bin counting method, albeit with uncertainties of the latter calculated without considering correlations (and thus larger uncertainty from bin counting than fitting)
slide 42: has some code from Qian to do multicity unfolding