SN0321 : The Performance of SVT-SDDs in AGS Experiment 896
Updated on Mon, 2007-06-18 19:57. Originally created by chajecki on 2007-06-18 19:57.
| Author(s) | : | The SDDA collaboration (1997): R. Bellwied, H. Caines, H. Dyke, Ying Guo, J. Hall, J. Hoffmann, T. Humanic, P. Jensen, I. Kotov, P. Kuczewski, B. Leonhardt, C. Liaw, G. LoCurto, D. Lynn, N. Mazeh, P. |
| Date | : | Jan. 12, 1998 |
| File(s) | : | sn0321.ps.gz |
| Abstract | : | The performance of silicon drift detectors (SDDs) in AGS Experiment 896 is discussed. STAR-SVT prototype wafers, in particular the latest design wafers (STAR 2.7 and STAR 2.9), are used in the setup. The front-end electronics consists of preamplifier/shaper die (PASA) and switched capacitor array die (SCA) mounted on a hybrid (or multichip module) circuit. In the SVT system test requirements document this constitutes STAGE 0 of the system test.
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